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7473945 |
Optical semiconductor integrated circuit device
Disclosed is an optical semiconductor integrated circuit device has an opening portion in an insulating layer, which is formed in a light receiving region of a photodiode stepwise. Thus, a step of...
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7459733 |
Optical enhancement of integrated circuit photodetectors
A semiconductor integrated circuit structure and method for fabricating. The semiconductor integrated circuit structure includes a light sensitive device integral with a semiconductor substrate, a...
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7459360 |
Method of forming pixel sensor cell having reduced pinning layer barrier potential
A method of forming a pixel sensor cell structure. The method of forming the pixel cell comprises forming a doped layer adjacent to a first side of a transfer gate structure for coupling a...
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7456449 |
Semiconductor apparatus, LED print head, and printer
A semiconductor apparatus has a substrate to which is attached a thin semiconductor film including at least one semiconductor device. An interconnecting line links the semiconductor film with...
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7449732 |
Substrate with transparent electrodes and devices incorporating it
The substrate with electrodes is formed of a transparent material onto which is deposited a film ( 1 ) of a transparent conductive material of thickness e 1 and of refractive index n 1 , said film...
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7446353 |
Solid-state imaging apparatus and charge transfer apparatus
A solid-state imaging apparatus includes a photoelectric conversion section generating a charge by photoelectric conversion; and a charge transfer section having first and second transfer...
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7442975 |
CMOS image sensor and method for fabricating the same
A CMOS image sensor and a method for fabricating the same prevent a lifting effect of microlenses. Also, a diffused reflection of microlenses is prevented. The CMOS image sensor includes...
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7439561 |
Pixel sensor cell for collecting electrons and holes
The present invention is a pixel sensor cell and method of making the same. The pixel sensor cell approximately doubles the available signal for a given quanta of light. The device of the present...
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7436038 |
Visible/near infrared image sensor array
A MOS or CMOS sensor for high performance imaging in broad spectral ranges including portions of the infrared spectral band. These broad spectral ranges may also include portions or all of the...
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7432576 |
Grid metal design for large density CMOS image sensor
A new grid metal design for image sensors is disclosed which is comprised of a semiconductor image sensor chip having a pixel region covering most of the chip and a logic circuit region on the chip...
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7432543 |
Image sensor pixel having photodiode with indium pinning layer
An active pixel using a pinned photodiode with a pinning layer formed from indium is disclosed. The pixel comprises a photodiode formed in a semiconductor substrate. The photodiode is an N − ...
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7432536 |
LED with self aligned bond pad
A method is disclosed for attaching a bonding pad to the ohmic contact of a diode while reducing the complexity of the photolithography steps. The method includes the steps of forming a blanket...
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7423305 |
Solid-state image sensing device having high sensitivity and camera system using the same
A solid-state image sensing device includes a plurality of pixels. Each pixel has a photodiode, a first transistor, and a second transistor. The photodiode is constituted by a...
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7423302 |
Pinned photodiode (PPD) pixel with high shutter rejection ratio for snapshot operating CMOS sensor
A pixel image sensor has a high shutter rejection ratio that prevents substrate charge leakage to a floating diffusion storage node of the pixel image sensor and prevents generation of...
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7422924 |
Image device and photodiode structure
The invention provides a photodiode with an increased charge collection area, laterally spaced from an adjacent isolation region. Dopant ions of a first conductivity type with a first impurity...
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7420236 |
Photoelectric conversion device and manufacturing method thereof
A photoelectric conversion device is provided which is capable of improving the light condensation efficiency without substantially decreasing the sensitivity. The photoelectric conversion device...
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7420231 |
Solid state imaging pick-up device and method of manufacturing the same
A proper incident state can be obtained in each pixel in accordance with a distance between an optical system and a sensor photoreceptive portion, and improved photoreceptive efficiency and even...
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7417272 |
Image sensor with improved dynamic range and method of formation
Embodiments of the invention provide an image sensor having an improved dynamic range. A pixel cell comprises at least one transistor structure. The transistor structure comprises at least one...
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7414276 |
Solid-state image pickup device and charge transfer device
A solid-state image pickup device includes a semiconductor substrate, a photosensitive pixel which converts incident light on the semiconductor substrate into a signal charge, and a charge...
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7411276 |
Photosensitive device
A photosensitive device having at least an insulator layer including a plurality of photoreceiving regions disposed on a substrate. A plurality of conductive patterns is disposed on the insulator...
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7411229 |
Semiconductor device, a manufacturing method thereof, and a camera
A semiconductor device includes a transfer channel for transferring charge generated by photoelectric conversion, an insulating film formed on the transfer channel, and a transfer electrode for...
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7408210 |
Solid state image pickup device and camera
An object of the present invention is to simultaneously realize the enlargement of a dynamic range and the downsizing of a pixel. An additional capacitor CS is composed by using: a first capacitor...
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7400022 |
Photoreceiver cell with color separation
A photoreceiver cell with separation of color components of light incident to its surface, formed in a silicon substrate of the conductivity of the first type with an ohmic contact and comprising:...
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7397086 |
Top-gate thin-film transistor
A thin-film transistor, such as a top-gate thin-film transistor, is provided herein. The thin-film transistor has a performance-enhancing layer, such as a performance-enhancing bottom layer,...
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7397076 |
CMOS image sensor with dark current reduction
Disclosed are a CMOS image sensor and a fabrication method thereof, which is adequate to reduce dark current. The CMOS image sensor comprises a device isolation region and an active region, which...
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7382009 |
Solid state image pickup device including an amplifying MOS transistor having particular conductivity type semiconductor layers, and camera using the same device
To provide an amplification type solid state image pickup device enabling lower noise, higher gain, and higher sensitivity than any conventional amplification type solid state image pickup device....
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7382003 |
Solid-state image pick-up unit and method of manufacturing the same
A solid-state image pick-up unit comprises: a semiconductor substrate comprising an area in which a photoelectric converting portion is formed; and an electric charge transfer portion that...
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7382002 |
Photo-detector and related instruments
An apparatus comprising at least one multilayer wafer includes a device layer adjacent to a barrier layer, and the device layer includes at least two photoconductive regions separated by an etched...
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7378691 |
Solid-state image sensor
A solid-state image sensor capable of suppressing blooming and increase of a dark current also when an n-type impurity concentration in a transfer channel region is increased is obtained. In this...
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7355268 |
High reflector tunable stress coating, such as for a MEMS mirror
An optical device having a high reflector tunable stress coating includes a micro-electromechanical system (MEMS) platform, a mirror disposed on the MEMS platform, and a multiple layer coating...
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7355228 |
Image sensor pixel having photodiode with multi-dopant implantation
An active pixel using a photodiode with multiple species of N type dopants is disclosed. The pixel comprises a photodiode formed in a semiconductor substrate. The photodiode is an N − region...
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7355227 |
Detecting pixel matrix integrated into a charge reader circuit
A matrix of detection pixels and a photoelectric detector that includes a matrix of detection pixels and a reading circuit of loads detected by the detection pixels of the matrix. A detection pixel...
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7355222 |
Imaging device having a pixel cell with a transparent conductive interconnect line and the method of making the pixel cell
The invention relates to an imaging device having a pixel cell with a transparent conductive material interconnect line for focusing incident light onto a photosensor and providing an electrical...
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7352028 |
Solid-state imaging devices
A solid-state imaging device includes: a substrate; a photoelectric transducer that is provided within the substrate and generates light-generated charge in accordance with incident light; a...
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7352020 |
Solid-state image pickup device, and manufacturing method thereof
The present invention aims to provide a solid-state imaging apparatus that realizes less leakage current, high image quality and low noise during the driving operation, and manufacturing method for...
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7329557 |
Method of manufacturing solid-state imaging device with P-type diffusion layers
A solid-state imaging device includes: a plurality of N-type photodiode regions formed inside a P-type well; a gate electrode having one edge being positioned adjacent to each of the photodiode...
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7323731 |
Photoelectric conversion device, method of manufacturing photoelectric conversion device, and image pickup system
A photoelectric conversion device comprising a semiconductor substrate of a first conduction type, and a photoelectric conversion element having an impurity region of the first conduction type and...
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7321141 |
Image sensor device and manufacturing method thereof
A semiconductor substrate is provided on which a plurality of shallow trench isolations (STI) defining a plurality of active areas are formed. The active areas comprise a photo sensing region, and...
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7309884 |
Semiconductor light receiving device and method of fabricating the same
A semiconductor light receiving device is disclosed which is capable of receiving a first wavelength band light beam and a second wavelength band light beam having a shorter wavelength than that of...
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7307327 |
Reduced crosstalk CMOS image sensors
CMOS image sensor having high sensitivity and low crosstalk, particularly at far-red to infrared wavelengths, and a method for fabricating a CMOS image sensor. A CMOS image sensor has a substrate,...
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7307297 |
Organic photodiode and method for manufacturing the organic photodiode
In an organic photodiode, in a gap between a transparent anode formed on a glass substrate, and a reflection cathode formed oppositely thereto, a plurality of light receiving parts as layers of...
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7301188 |
CMOS image sensor and method of manufacturing the same
An image sensor includes a substrate with an epitaxial layer deposited thereon, a plurality of photodiodes buried in the epitaxial layer, and a plurality of field oxide films interposed between the...
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7242043 |
Imaging device and manufacturing method thereof
Disclosed is an imaging device including a photodiode and floating diffusion region formed to be spaced from each other on a surface layer of a pixel region of a silicon (semiconductor) substrate,...
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7238977 |
Wide dynamic range sensor having a pinned diode with multiple pinned voltages
A pixel cell has controlled photosensor anti-blooming leakage by having dual pinned voltage regions, one of which is used to set the anti-blooming characteristics of the photosensor. Additional...
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7238562 |
Method for fabricating CMOS image sensor
A method for fabricating a CMOS image sensor is disclosed, to decrease a dark current, which includes the steps of forming a photodiode area in a semiconductor substrate; forming a plurality of...
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7235826 |
Solid-state image pickup device
A solid-state image pickup device 1 according to the present invention includes a semiconductor substrate 2 on which a pixel 20 composed of a photodiode 3 and a transistor is formed. The...
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7227208 |
Solid-state image pickup apparatus
The invention is to suppress a leak current in a photodiode and an unevenness in the leak currents. In a photoelectric converting device including a channel stop area of a higher concentration than...
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7217968 |
Recessed gate for an image sensor
A novel image sensor cell structure and method of manufacture. The imaging sensor comprises a substrate, a gate comprising a dielectric layer and gate conductor formed on the dielectric layer, a...
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7217967 |
CMOS image sensor and method for manufacturing the same
A CMOS image sensor and a manufacturing method thereof are disclosed. The gates of the transistors are formed in an active region of a unit pixel, and at the same time, a passivation layer is...
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7217953 |
Technique for suppression of edge current in semiconductor devices
A passive mechanism suppresses injection, into any active guard regions interposed between the edge of a photodiode array chip and the outer photodiode pixels or into the outer pixels themselves,...
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