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Magnetic resonance imaging apparatus and magnetic resonance imaging method

April 29, 2008

An MRI apparatus includes an imaging signal acquisition unit, a motion signal acquisition unit, a motion amount determination unit, a motion correction unit and an image reconstruction unit. The imaging signal acquisition unit acquires MR signals as imaging signals. The motion signal acquisition unit repetitively acquires MR signals having PE amount less than that of the imaging signals as motion signals. The motion amount determination unit obtains a motion amount using the motion signals. The motion correction unit performs correction processing of the imaging signals in accordance with the motion amount. The image reconstruction unit reconstructs an image using the imaging signals after the correction processing.

Passively shielded inductive sensor system for personnel screening

April 29, 2008

An inspection system includes an electromagnetic shield having electrically conductive sidewalls spaced from one another. The shield also includes a conductive third wall which spans the distance between the sidewalls, and is electrically coupled to the sidewalls. The inspection system also has an inductive sensor positioned within the electromagnetic shield. The inductive sensor has two current branches, which exhibit anti-symmetric current flow. Typically, the two current branches are positioned on opposing sides of the medial plane of the electromagnetic shield.

Integrated circuit for determining a voltage

April 29, 2008

An integrated circuit includes a current generator circuit with a first input terminal for applying a reference voltage and a second input terminal for applying an input voltage, which is generated internally from an externally applied supply voltage by a voltage generator circuit. The current generator circuit is connected to an output terminal via an interconnect. A first current flows on the interconnect in a test operating state of the integrated circuit. The current generator circuit generates a first partial current in a first test cycle of a test operating state and a second partial current in a subsequent second test cycle. The partial currents are each superposed on the first current on the interconnect. Consequently, three currents occur at the output terminal during the test operating state. The internally generated input voltage of the current generator circuit is determined from the three currents and the reference voltage.

Probe card assembly

April 29, 2008

A probe card assembly has a probe contractor substrate having a plurality of probe contractor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contractor substrate are vertically adjustable until secured by a locking mechanism which is coupled to the probe card wiring board. When the posts are secured in a fixed position, the position is one in which the plane of the plurality of probe contractor substrates is substantially parallel to a predetermined reference plane.

Two-axial pad formation resistivity imager

April 29, 2008

A resistivity imaging device injects currents in two orthogonal directions using two pairs of return electrodes and performing impedance measurements of the buttons placed between the returns.

Display device and method of testing sensing unit thereof

April 29, 2008

A display device includes first and second display signal lines, pixels, first and second sensing signal lines, first through fourth test lines for transmitting first through fourth test signals, a first switching element connected to the first and second test lines, and the first sensing signal line, second switching elements connected to the first switching element, the second test line, and a subset of first display signal lines, a third switching element connected to the third and fourth test lines, and the second sensing signal line, and fourth switching elements connected to the third switching element, the fourth test line, and a subset of second display signal lines.

Apparatus and method for non-destructive testing of primers, in particular for airbags in motor vehicles

April 29, 2008

A measuring device and a measuring method for non-destructive testing of an ignitor installed in a subassembly, particularly of a motor vehicle. The device and measuring method generate a measuring current with a predefined value, check-test the predefined value of the measuring current while bypassing the ignitor, apply the check-tested measuring current to the subassembly with the installed ignitor for a predefined time interval, determine the internal resistance of the subassembly with the installed ignitor, and derive a test signal indicating the installation condition based on a comparison with a setpoint value.

In-tray burn-in board, device and test assembly for testing integrated circuit devices in situ on processing trays

April 29, 2008

A burn-in board for burn-in and electrical testing of a plurality of integrated circuit devices that is disposed in one or more processing trays may include a substrate having an interface surface and a plurality of electrical contacts disposed on the interface surface for establishing, through engagement with the one or more processing trays, electrical communication between the leads of the integrated circuit devices and a tester. One or more ports may be defined in the substrate so as to extend between the interface surface and another surface of the substrate wherein the port or ports are sized and configured to enable application of a negative pressure between the substrate and the one or more processing trays upon engagement of the substrate therewith and upon application of a vacuum through the one or more ports.

Method and apparatus of voltage measurement using flying capacitor and switching circuits

April 29, 2008

The present invention is to provide a method and apparatus of voltage measurement with a high resolution. An apparatus of voltage measurement includes: a buffer circuit for separating a voltage between terminals of a capacitor or an equivalent voltage into a first voltage region corresponding to a full scale of an analog/digital (A/D) converter and a second voltage region corresponding to a voltage exceeding the full scale of the A/D converter when the voltage between the terminals of the capacitor charged or the equivalent voltage is higher than the full scale of the A/D converter; the A/D converters corresponding to the first and second voltage regions for converting the voltages of the respective regions from analog to digital values; and a voltage measurement device for evaluating a measured voltage value from the digital values and calculating the voltage of the voltage supply.

Hybrid magnet configuration

April 29, 2008

A co-axial magnet configuration for the production of a magnetic field and investigational volume which is suitable for measurement of magnetic resonance has at least one superconducting solenoid coil or solenoid coils which are radially nested within each other, wherein the windings of the solenoid coil(s) in a radial region about the axis of the magnetic configuration are disposed between r 1 and r 2 , wherein r 1< r 2 is characterized in that the windings are surrounded by at least one rotationally symmetric magnet body made from ferromagnetic material which extends over a radial region between r 3 and r 4 wherein r 3< r 4 wherein r 2< r 3 <1.3 r 2 and r 4 >1.3 r 3 , wherein the rotationally symmetric magnet body or bodies are structured, dimensioned and positioned in such a fashion that the magnetic field is homogenized in the investigational volume and the magnetic fringe field outside the magnet configuration is essentially suppressed to permit the production of strong magnetic fields of high homogeneity without requiring notches in the coil configuration.

MRI apparatus which automatically determines and displays operating instructions

April 29, 2008

An MRI apparatus in which a magnetic field is applied to a subject, a receiver coil attached to the subject receives a magnetic resonance signal generated in the subject, and a magnetic resonance image of the subject is generated from the magnetic resonance signal, the apparatus comprising a gantry which comprises a magnetic-field generating unit for generating the magnetic field, a determining unit which determines the type of the receiver coil, a first memory unit which stores data items representing a plurality of methods of attaching various receiver coils, each method designated for one receiver coil, and a monitor which is provided on the gantry and which displays one of the methods stored in the first memory unit, which pertains to the receiver coil whose type has been determined by the determining unit.

Apparatus and method for testing liquid crystal display panel

April 29, 2008

An apparatus and a method testing liquid crystal display panel which are able to test whether or not burr remains on longer sides and on shorter sides of a unit liquid crystal display panel using first to fourth testing bars in a touch method, and able to measure a distance between the longer sides and a distance between the shorter sides of the unit liquid crystal display panel.

MR data acquisition method, MR image construction method, and MRI system

April 29, 2008

An object of the present invention is to acquire data, which is used to construct a water component-enhanced/fat component-suppressed image, with a repetition time TR set to a desired value. Included are a data acquisition unit and an image construction unit. The data acquisition unit acquires data D_φfat according to a steady-state pulse sequence specifying that the phase of an RF pulse is varied in order of 0, 1×φfat, 2×φfat, etc. Herein, φfat=(2−TR/T_out+2×m)×π is established on the assumption that m denotes an integer equal to or larger than 0 and meets TR/(2×T_out)−1

Semiconductor device testing

April 29, 2008

An apparatus and method to test components in a semiconductor test structure. On a semiconductor wafer, a test module implemented in one or more scribe lines between a plurality of semiconductor dies is used to test components in the semiconductor test structure. The test module may, for example, test electrical characteristics of chains of vias, transistors, and functional devices, such as oscillators. The test module contains a scan chain control coupled through a plurality of pass gates to each component to be tested. The scan chain control sequentially closes the pass gates to separately test the components in the semiconductor test structure. The test module further interfaces with an external testing device and the results of each test are compared with the expected results to identify faulty components.

Test probe and tester, method for manufacturing the test probe

April 29, 2008

A test probe having a conductive part electrically connected to terminals of a test-object device, including: a silicon substrate; a protrusion made of resin provided on the silicon substrate; a first conductive part which is provided on the protrusion and comes in contact with the terminals; and a second conductive part which is provided in a region other than a region having the protrusion on the silicon substrate and is electrically connected to the first conductive part.

Magnetic reader recording characterization at slider or bar level

April 29, 2008

An apparatus for reader characterization is described. The apparatus includes a rotator for rotating a media. The media can contain a signal having a value for a function of a read/write head being assessed. The rotator is operable in conjunction with said apparatus. The apparatus also includes a proximator for proximalizing the media to the read/write head. The proximator is operable in conjunction with said apparatus. The apparatus further includes a writer operable in conjunction with said assembly. The writer writes the signal upon the media. The signal emits the value of the function. The signal is detectable by a reader of the read/write head. The apparatus additionally includes an interface operable in the apparatus for providing removable orientation of the read/write head in an assessing position. The assessing position enables a reader of the read/write head to detect the signal upon rotation of the signal through the assessing position.

Excess overdrive detector for probe cards

April 29, 2008

A novel structure for a probe card that comprises a deformable metal or other deformable material for detecting excess overdrive and a method for using the same are disclosed. This detection structure may be positioned on the substrate along the bending path of the probe, such that should the probe experience excess overdrive, then the detection structure will permanently deform where it is hit by any portion of the probe. Alternatively, the detection structure may be embedded in the substrate, and may also function as a fiducial for alignment detection. Inspection of the probe card, and specifically the detection structure, will reveal whether any probe has experienced excess overdrive. Should the inspection reveal that certain regions of the card experienced excess overdrive, this may indicate a planarity problem that affects production line yield.

Method and apparatus for MR image acquisition wherein operating parameter sets are displayed with an image element indicative of an acquisition result

April 29, 2008

In a method and MR apparatus for acquisition of images of an examination region of a human or animal body by means of measurement parameter sets controlling the image acquisition, selection of an examination region to be acquired is made by a user according to anatomical viewpoints by means of a whole-body representation of an image element of the body (stored in a storage region for image data) on a monitor. A list of measurement parameter sets for the selected region is displayed on the monitor, with the measurement parameter sets in the list each being shown with at least one region-specific image element (stored in a storage region) of an acquisition result that can be obtained with this measurement parameter set. A measurement parameter set for image acquisition is then selected.

Closed-loop magnetic sensor system

April 29, 2008

A closed loop magnetic sensor system for measuring an input magnetic field from a magnetic field source has a compensation circuit, which can be for example a printed wire board, and a magnetic sensor, such as a Magnetoresistive (MR) sensor, for measuring an input magnetic field. Preferably, the magnetic sensor is magnetically coupled to the compensation circuit by arranging the magnetic sensor in an air gap provided in the compensation circuit. The compensation circuit has a compensating conductor, arranged on or in a dielectric medium, which can be configured as a plurality of nested coils. Electrical control circuitry, electrically, coupled to the magnetic sensor and compensating conductor, is adapted and arranged to drive a feedback current through the compensating conductor according to the output of the magnetic sensor such that the input magnetic field is substantially compensated at the magnetic sensor. The magnetic system can serve as current sensor for sensing current through a primary conductor.

System and method for measuring on-chip supply noise

April 29, 2008

A method and system for measuring noise of an on-chip power supply. In an embodiment, the system comprises a delay line that receives as an input a signal such as a square wave. The delay line may comprise a series of inverters connected to the power supply. The output of the delay line may combine the input signal and the noise signal from the power supply to produce a series of delayed versions of the input signal. Analysis of the output signal yields characteristics associated with the noise signal of the power supply such as its spectrum. In another embodiment, the system may comprise at least one mixer that modulates an input signal, such as a sinusoid, with the noise signal of the power supply. Demodulating the mixed signal then yields the noise signal of the power supply for further analysis.

Integrated circuit testing module including data generator

April 29, 2008

Systems and methods of testing integrated circuits are disclosed. The systems include a test module configured to operate between an automated testing equipment and an integrated circuit to be tested. The testing interface is configured to test the integrated circuit at a higher clock frequency than the automated testing equipment is configured to operate. In order to do so, the testing interface includes components configured for generating addresses and test data to be provided to the integrated circuit. A variety of test data patterns can be produced and the test data can be address dependent.

Low impedance test fixture for impedance measurements

April 29, 2008

A test fixture couples with a test instrument to measure impedance of a device. An upper layer of the test fixture has (a) a first and a second solder pad for electrical connection to the device, (b) a first, second, third and fourth multi-solder pad for electrical connection to four connectors, (c) a first conductor track for connecting the first solder pad to a signal solder pad of the first multi-solder pad, (d) a second conductor track for connecting the first solder pad to a signal solder pad of the second multi-solder pad, (e) a third conductor track for connecting the second solder pad to a signal solder pad of the third multi-solder pad, and (f) a fourth conductor track for connecting the second solder pad to a signal solder pad of the fourth multi-solder pad. Each multi-solder pad has at least one return path solder pad. A lower layer of the test fixture has conductor tracks connected to the return path solder pad of each multi-solder pad. A dielectric substrate of the test fixture has substantially uniform thickness separating the upper layer from the bottom layer.

Semiconductor device, method for testing the same and IC card

April 29, 2008

A semiconductor device has a boosting circuit configured to generate a boosting potential to an output line. An internal circuit is supplied with the boosting potential from the boosting circuit via the output line. A test line is connected to the output line. A control circuit is arranged between the output line and the test line and configured to shut off a current flowing into the test line from the output line during a boosting operation of the boosting circuit.

Nuclear magnetic resonance apparatus and method for assessing whole body composition

April 29, 2008

A method is disclosed for measuring whole body composition. The method includes confining movement of the body to a selected volume, inducing a static magnetic field in the volume, inducing a pulsed radio frequency magnetic field in the volume, and receiving nuclear magnetic resonance signals from the body. The resonance signals from any part of the body are substantially independent of a position of the body part within the volume. Whole body composition is assessed from the resonance signals.

Flexible RF coil assembly and method of making same

April 29, 2008

An RF coil assembly includes a plurality of coil supports rotatably interconnected to each other. Each coil support is configured to rotate with respect to at least one adjoining coil support. A plurality of RF coils is connected to each coil support.

Method and apparatus for vibration detection

April 29, 2008

Apparatus for detecting vibration of an object adapted to rotate includes one or more vibration processors selected from: a direction-change processor adapted to detect changes in a direction of rotation of the object, a direction-agreement processor adapted to identify a direction of rotation of the object in at least two channels and identify an agreement or disagreement in direction of rotation identified by the at least two channels, a phase-overlap processor adapted to identify overlapping signal regions in signals associated with the rotation of the object, and a running mode processor adapted to identify an unresponsive output signal from at least one of the at least two channels. A method for detecting the vibration of the object includes generating at least one of a direction-change output signal with the direction-change processor, a direction-agreement output signal with the direction-agreement processor, a phase-overlap output signal with the phase-overlap processor, and a running-mode-vibration output signal with the running-mode processor, each indicative of the vibration the object.

Signal-processing unit for fluxgate magnetometers

April 29, 2008

A signal processing unit includes an integrating unit. The integrating unit is composed of a plurality of digital elements and is operative to integrate a detection signal over every quarter of one cycle of the detection signal to generate an integration value. The integration values to be generated are represented as S 1 , S 2 , S 3 , and S 4 . A calculating unit includes a plurality of digital elements and performs addition and subtraction on the generated integration values in accordance with the following equations used to calculate an in-phase component and a quadrature-phase component of (Ip=S 4 p− 3 +S 4 p− 2− S 4 p− 1 −S 4 p ) and (Qp=S 4.4− S 4 p −−S 4 p− 1+ S 4 p ). Where Ip represents the in-phase component and Qp represents the quadrature-phase component. An amplitude obtaining unit obtains an amplitude of the detection signal based on the in-phase component and the quadrature-phase component.

Current sensing for power MOSFETs

April 29, 2008

A power MOSFET, comprising main and current mirror MOSFETs, has a current sense resistance coupled between its mirror and source terminals and a monitoring circuit responsive to a first voltage dependent upon current through the current sense resistance. The circuit arrangement includes a circuit that determines a second voltage, different from the first voltage, of a terminal of the current mirror MOSFET, and a circuit arranged to determine current of the power MOSFET in dependence upon the first and second voltages. The second voltage can be the voltage at the drain terminal, or the voltage at the mirror terminal with switching of the current sense resistance or a current that it passes. It can alternatively be determined by a control circuit to be a desired fraction of the drain voltage.

Test structure design for reliability test

April 29, 2008

A flexible semiconductor test structure that may be incorporated into a semiconductor device is provided. The test structure may include a plurality of test pads designed to physically stress conductive lines to which they are attached during thermal cycling. By utilizing test pads with different dimensions (lengths and/or widths), the effects of thermal stress generated by a plurality of conductive lines having corresponding different dimensions may be simulated.

Apparatus for measuring magnetic fields using a superconducting quantum interference device

April 29, 2008

An instrument for measuring sub-pico Tesla magnetic fields using a superconducting quantum interference device (SQUID) inductively coupled to an unshielded gradiometer includes a filter for filtering magnetically-and electrically coupled radio frequency interference (RFI) away from the SQUID. This RFI is principally coupled to the SQUID via the unshielded gradiometer. The filter circuit includes a resistor-capacitor (RC) combination interconnected to first and second terminals so that it is parallel to both an input coil of the SQUID and the gradiometer. In addition, a shielding enclosure is used to electromagnetically shield the filter circuit from the SQUID, and a method is employed to increase the impedance between the input coil and the SQUID without diminishing the overall sensitivity of the instrument.

Nuclear magnetic resonance method for body composition analysis

April 29, 2008

A method is disclosed for analyzing composition of a body part from nuclear magnetic resonance measurements made on the body part. The method includes exciting a predetermined sequence of nuclear magnetic resonance phenomena in the body part and measuring nuclear magnetic resonance signals from the body part. At least a part of the measured signals are composed into a measurement vector. The mass of the at least one constituent is determined as a predetermined function of the measurement vector. The predetermined function represents the at least one constituent and defines a standard for a range of at least one of compositional variations and temperature variations of the at least one constituent.

Method of using G-matrix fourier transformation nuclear magnetic resonance (GFT NMR) spectroscopy for rapid chemical shift assignment and secondary structure determination of proteins

April 29, 2008

The present invention presents a new approach to rapidly obtaining precise high-dimensional NMR spectral information, named “GFT NMR spectroscopy”, which is based on the phase sensitive joint sampling of the indirect dimensions spanning a subspace of a conventional NMR experiment. The phase-sensitive joint sampling of several indirect dimensions of a high-dimensional NMR experiment leads to largely reduced minimum measurement times when compared to FT NMR. This allows one to avoid the “sampling limited” data collection regime. Concomitantly, the analysis of the resulting checmical shift multiplets, which are edited by the G-matrix transformation, yields increased precision for the measurement of the chemical shifts. Additionally, methods of conducting specific GFT NMR experiments as well as methods of conducting a combination of GFT NMR experiments for rapidly obtaining precise chemical shift assignment and determining the structure of proteins or other molecules are disclosed.

Magneto-optic remote sensor for angular rotation, linear displacements, and evaluation of surface deformations

April 29, 2008

A system and method to detect angular rotation, linear displacement and/or surface deformations is presented. The method is based on the ability of a linear polarized light to interact with magnetic materials and to change its polarization angle due to Faraday effect. A basic structure of the system consists of a magneto-optic (MO) film with a two-domain structure and a single domain wall which are generated by gradient magnetic field produced by opposite polarity permanent magnets placed near the film. An AC magnetic field applied perpendicular to the MO film surface causes the magnetic domain wall in the MO film to oscillate at the same frequency. This leads to a detected output AC modulated signal. By measuring the temporal changes in this signal, information on angular rotation, linear displacement and/or surface deformation can be obtained.

Method of making a contact

April 29, 2008

Embodiments of the present invention are directed to the formation of microprobe tips elements having a variety of configurations. In some embodiments tips are formed from the same building material as the probes themselves, while in other embodiments the tips may be formed from a different material and/or may include a coating material. In some embodiments, the tips are formed before the main portions of the probes and the tips are formed in proximity to or in contact with a temporary substrate. Probe tip patterning may occur in a variety of different ways, including, for example, via molding in patterned holes that have been isotropically or anisotropically etched silicon, via molding in voids formed in over exposed photoresist, via molding in voids in a sacrificial material that have formed as a result of the sacrificial material mushrooming over carefully sized and located regions of dielectric material, via isotropic etching of a the tip material around carefully sized placed etching shields, via hot pressing, and the like.

Permanent magnet, magnetic device for use in MRI including the same, and manufacturing processes thereof

April 29, 2008

The present invention provides a permanent magnet, comprising a cylinder formed with a permanent magnetic material. The cylinder comprises along a radial direction, a magnetic core and a magnetic sheath that are coaxial. The magnetic core is assembled in the magnetic sheath. The magnetization direction of the magnetic core is axial direction, and the magnetization direction of the magnetic sheath changes step by step from a direction which is parallel to the magnetization direction of the magnetic core in one end to a direction which is orthogonal to the magnetization direction of the magnetic core in the other end, along the axial direction of the cylinder. Moreover, a magnetic device for use in MRI using the magnet and manufacturing methods for the permanent magnet and the magnetic device are also provided in the present invention. With the permanent magnet, magnetization strength in the working area generated by the magnetic device for use in MRI can amount to more than 0.5-0.6 T.

Method of testing using compliant contact structures, contactor cards and test system

April 29, 2008

A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein. The compliant contact structure includes a portion fixed within the substrate and at least another portion integral with the fixed portion, laterally unsupported within a thickness of the substrate and extending beyond a side thereof. Dual-sided compliant contact structures, methods of forming compliant contact structures, a method of testing a semiconductor device and a testing system are also disclosed.

Circuit configuration for recognizing the occupancy of a seat and seatbelt warning in a motor vehicle

April 29, 2008

A circuit configuration recognizes the occupancy of a seat and triggers a seat belt warning in a motor vehicle. Resistance elements are disposed in a separated and flat manner on a motor vehicle seat, in particular on a sensor seating mat, which alters the resistance values when a force is exerted thereon, for example, perpendicular to the surface of the vehicle seat, or by bending. The weight-sensitive resistance elements contain first resistance elements and additional resistance elements, and the resistance values thereof can be measured in respectively different measuring circuits without the measuring results for the first resistance elements influencing the measuring results for the additional resistance elements.

Methods of adjusting airborne geophysical measurements based on mapping instrument measurements

April 29, 2008

This invention concerns a method of making airborne geophysical measurements. Such measurements may be made from fixed or moving wing airplanes or dirigibles. The method comprises the following steps: taking first real time measurements from one, or more, geophysical instruments mounted in an aircraft to produce geophysical data related to the ground below that instrument. Taking second real time measurements from navigation and mapping instruments associated with or carried by the aircraft. Computing a background response of each geophysical instrument using the second real time measurements to take account of its time varying altitude, and the time varying topography of the ground below it. Adjusting an operating or data processing condition of each geophysical instrument using the respective background response and the instrument's attitude to enhance the performance of that instrument. And, adjusting the geophysical data output for that instrument having reduced effects resulting from variations in altitude, attitude and topography.

Electronic circuit analyzing apparatus, electronic circuit analyzing method, and electronic circuit analyzing program

April 29, 2008

The present invention provides an electronic circuit analyzing apparatus for evaluating the reliability value of an analysis result, an electronic circuit analyzing method, and an electronic circuit analyzing program. The electronic circuit analyzing apparatus comprises an input information storage unit 1 that stores input information, an analytic model creation unit 12 that creates an analytic model of an electronic circuit on the basis of the input information, an analysis unit 3 that calculates an analysis result of the electronic circuit using the analytic model, a partial model reliability value database 21 that defines the accuracy of each part of the analytic model and stores the accuracy value as a partial model reliability value, a partial model influence database 22 that defines the magnitude of influence of each part of the analytic model and stores the influence value as a partial model influence, a reliability value evaluation unit 23 that calculates an analysis result reliability value, i.e. the reliability value of the analysis result, on the basis of the partial model reliability value and partial model influence, an analysis result determination unit 14 that determines whether the analysis result is good or bad, and a display unit 15 that displays the analysis result reliability value and the result of the good/bad determination.